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VLSI Design
Volume 2008, Article ID 680157, 8 pages
http://dx.doi.org/10.1155/2008/680157
Research Article

A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences

Department of Informatics, Technological Educational Institute of Athens, Athens 12210, Greece

Received 27 March 2007; Accepted 5 December 2007

Academic Editor: Bashir M. Al-Hashimi

Copyright © 2008 Ioannis Voyiatzis. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Ioannis Voyiatzis, “A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences,” VLSI Design, vol. 2008, Article ID 680157, 8 pages, 2008. https://doi.org/10.1155/2008/680157.