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VLSI Design
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Special Issues
VLSI Design
/
2008
/
Article
/
Fig 5
/
Research Article
A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
Figure 3
𝑑
m
i
n
/
𝑑
m
a
x
for various values of
𝑛
and
𝑇
.