Review Article

Advancement in Nanoscale CMOS Device Design En Route to Ultra-Low-Power Applications

Figure 14

(a)–(c) Threshold voltage measured on real bulk devices CMOS 90- and 65-nm technologies, 𝐼 O N 𝐼 O F F , respectively [15].
178516.fig.0014a
(a)
178516.fig.0014b
(b)
178516.fig.0014c
(c)