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Special Issues
VLSI Design
/
2011
/
Article
/
Fig 6
/
Review Article
The Impact of Statistical Leakage Models on Design Yield Estimation
Figure 6
Histogram (pdf plot) of
l
n
(
𝑌
)
shows that the FW method does not model the body of the (
𝑧
or
𝛿
𝑉
𝑡
) distribution well compared to other methods.
(a)
(b)
(c)
(d)