The Impact of Statistical Leakage Models on Design Yield Estimation

<table>Plot of the mean and standard deviation of <svg height="10.325" id="M141" style="vertical-align:-0.0pt" version="1.1" viewbox="0 0 11.6125 10.325" width="11.6125" xmlns="http://www.w3.org/2000/svg">
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</svg> obtained from the different approximations.  SY and LMM methods that match moments of <svg height="13.5625" id="M142" style="vertical-align:-2.21957pt" version="1.1" viewbox="0 0 38.862499 13.5625" width="38.862499" xmlns="http://www.w3.org/2000/svg">
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</svg> falls behind for larger <svg height="10.875" id="M143" style="vertical-align:-3.25793pt" version="1.1" viewbox="0 0 15.375 10.875" width="15.375" xmlns="http://www.w3.org/2000/svg">
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</svg> (&gt;1 or 4 dB).</table>

VLSI Design

The Impact of Statistical Leakage Models on Design Yield Estimation

Figure 7