The Impact of Statistical Leakage Models on Design Yield Estimation

<table>Log probability tail plot as function of <svg height="10.875" id="M152" style="vertical-align:-3.25793pt" version="1.1" viewbox="0 0 15.375 10.875" width="15.375" xmlns="http://www.w3.org/2000/svg">
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</svg> range (4–8 dB) SY, FW and LMM methods miss the right tail.</table>

VLSI Design

The Impact of Statistical Leakage Models on Design Yield Estimation

Figure 9