Research Article

Line Search-Based Inverse Lithography Technique for Mask Design

Table 1

Pattern and runtime comparison between [16] and ours.

No.Mask size (pixel)Pixel size (nm)Feature size (nm)Pattern errorRuntime (s)
[16](%)[16] with our runtime(%)Ours[16](%)Ours

1184 × 1845.625451512(9.88)1566(13.81)1376192(−49.61)381
2400 × 4005.625453308(24.17)3780(41.89)266413337(13.24)11778
32000 × 20005.62545108144(8.55)109267(9.68)9962417918(−0.38)17986
42000 × 20005.6254561350(10.72)66516(20.05)5540912457(19.81)10397
54000 × 40005.6254558410(198.39)58410(198.39)1957578652(16.34)67603
62000 × 2000432101785(75.18)102100(75.72)5810449333(13.45)43485
72000 × 200043264252(39.49)75300(63.47)4606351856(−21.57)66117
84000 × 4000432148356(358.80)148420(358.99)3233662008(43.35)43255
94000 × 400043252160(153.30)52160(153.30)2059271489(5.77)67588

Average97.61103.924.49