Test Generation for Crosstalk-Induced Delay Faults in VLSI Circuits Using Modified FAN Algorithm

Table 5

Comparison of number of transitions between FAN and PODEM.

Circuit name	Number of transitions		% Reduction in number of transitions over
	FAN	PODEM	PODEM
c17	94	117	19.66
c432	199585	345413	42.21
c499	380926	374882	−1.58
c880	130217	112465	−13.63
c1908	430634	458133	6.00
s27	338	285	−15.68
s208	2131	3317	35.75
s208.1	930	1837	49.37
s298	6388	8860	27.90
s526	8036	13100	38.65
s386	15385	26760	42.50
s510	4747	10175	53.34
s420.1	3435	8036	57.25
s1196	107765	222839	51.63
s1238	69164	116570	40.66
Average			28.93