Research Article

A Discrete Event System Approach to Online Testing of Speed Independent Circuits

Table 3

Fault coverage, area overhead ratio, and execution time for the online detector designed using the proposed approach.

CUT Number of gates Number of faults Fault coverage (%) Area overhead Execution (sec)

Circuit 1322950.80.12
Circuit 2 5 32 96 1.5 0.23
Circuit 3 5 54 98 1.2 0.34
2 David cells [5] 6 44 94 1.6 0.22
4 David cells [5] 12889310.40
chu172 947960.240.36
alloc-outbound 15 130 98 0.13 0.42
sbuf-read-ctl 19 152 95 0.12 0.51
sbuf-send-ctl 18 140 94 0.087 0.47
ram-read-sbuf 23 197 93 0.025 0.56

Executed in AMD Phenom IIX3 710 Processor with 4 GB RAM in Linux OS.