VLSI Design

Table of Contents: 1993

  • VLSI Design -
  • Special Issue
  • - Volume 1
  • - Article ID 076586

Overlapped Subarray Segmentation: An Efficient Test Method for Cellular Arrays

Earl E. Swartzlander | Miroslaw Malek
  • VLSI Design -
  • Special Issue
  • - Volume 1
  • - Article ID 069351

Editorial

  • VLSI Design -
  • Special Issue
  • - Volume 1
  • - Article ID 081360

Built-In Self-Test: Milestones and Challenges

Jacob Savir | Paul H. Bardell
  • VLSI Design -
  • Special Issue
  • - Volume 1
  • - Article ID 034963

Theory, Analysis and Implementation of an On-Line BIST Technique

Rajiv Sharma | Kewal K. Saluja
  • VLSI Design -
  • Special Issue
  • - Volume 1
  • - Article ID 026728

Guest Editorial

Sunil R. Das
  • VLSI Design -
  • Special Issue
  • - Volume 1
  • - Article ID 073024

About the Editor in Chief and the Guest Editor

  • VLSI Design -
  • Special Issue
  • - Volume 1
  • - Article ID 089495

Computer-Aided Testing Systems: Evaluation and Benchmark Circuits

Samiha Mourad
  • VLSI Design -
  • Special Issue
  • - Volume 1
  • - Article ID 042309

Coverage of Node Shorts Using Internal Access and Equivalence Classes

Warren H. Debany
  • VLSI Design -
  • Special Issue
  • - Volume 1
  • - Article ID 084924

Conditional Disconnection Probability in Star Graphs

Walid Najjar | Pradip K. Srimani
  • VLSI Design -
  • Special Issue
  • - Volume 1
  • - Article ID 038536

Analysis and Design of Regular Structures for Robust Dynamic Fault Testability

Michael J. Bryan | Srinivas Devadas | Kurt Keutzer

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