VLSI Design

Table of Contents: 2001

  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 069472

2D-Hydrodynamic Energy Model Including Avalanche Breakdown Phenomenon for Power Field Effect Transistors

M. Rousseau | J. C. De Jaeger
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 023186

Measurement and Simulation of Boron Diffusivity in Strained Si1xGex Epitaxial Layers

K. Rajendran | W. Schoenmaker
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 019585

Simulation of Optoelectronic Devices

Paolo Lugli | Fabio Compagnone | ... | Andrea Reale
  • VLSI Design -
  • Special Issue
  • Volume 12
  • - Article ID 053729

A Size-optimization Design for Variable Length Coding Using Distributed Logic

Shih-Chang Hsia | Chien-Cheng Tseng
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 064901

Calculation of Transport Parameters of SiO2 Polymorphs

Elena Gnani | Susanna Reggiani | ... | Massimo Rudan
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 018514

Electronic Transport in Self-organised Molecular Nanostructured Devices

A. Pecchia | B. Movaghar | ... | N. Boden
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 061328

Monte Carlo Study of the Lateral Distribution of Gate Current Density Along the Channel of Submicron LDD MOSFET's

A. Harkar | R. W. Kelsall | J. N. Ellis
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 014941

Simulation of Widebandgap Multi-Quantum Well Light Emitting Diodes

D. Oriato | Alison B. Walker | W. N. Wang
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 057564

Hot Electron Modelling of HEMTs

Eric A. B. Cole | Christopher M. Snowden | Shahzad Hussain
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 010378

Investigation of the Local Force Approximation in Numerical Device Simulation by Full-band Monte Carlo Simulation

C. Jungemann | B. Neinhüs | B. Meinerzhagen
  • VLSI Design -
  • Special Issue
  • - Volume 12
  • - Article ID 091710

BIST Analysis of an Embedded Memory Associated Logic

Jacob Savir
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 052981

Simulation of Submicron Silicon Diodes with a Non-Parabolic Hydrodynamical Model Based on the Maximum Entropy Principle

O. Muscato | V. Romano
  • VLSI Design -
  • Special Issue
  • - Volume 12
  • - Article ID 045324

An Efficient Test Pattern Generation Scheme for an On Chip BIST

B. K. S. V. L. Varaprasad | L. M. Patnaik | ... | V. K. Agrawal
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 095706

Visualization of Large-scale Atomic Interactions During the Melting and Crystallization Process

Roman Durikovic
  • VLSI Design -
  • Special Issue
  • - Volume 12
  • - Article ID 087048

Random Pattern Testability Enhancement by Circuit Rewiring

Shih-Chieh Chang | Kwen-Yo Chen | ... | Sunil R. Das

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