VLSI Design

Table of Contents: 2001

  • VLSI Design -
  • Special Issue
  • - Volume 12
  • - Article ID 091710

BIST Analysis of an Embedded Memory Associated Logic

Jacob Savir
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 052981

Simulation of Submicron Silicon Diodes with a Non-Parabolic Hydrodynamical Model Based on the Maximum Entropy Principle

O. Muscato | V. Romano
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 095706

Visualization of Large-scale Atomic Interactions During the Melting and Crystallization Process

Roman Durikovic
  • VLSI Design -
  • Special Issue
  • - Volume 12
  • - Article ID 045324

An Efficient Test Pattern Generation Scheme for an On Chip BIST

B. K. S. V. L. Varaprasad | L. M. Patnaik | ... | V. K. Agrawal
  • VLSI Design -
  • Special Issue
  • - Volume 12
  • - Article ID 087048

Random Pattern Testability Enhancement by Circuit Rewiring

Shih-Chieh Chang | Kwen-Yo Chen | ... | Sunil R. Das
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 049319

Evaluation of an Equivalent Hole Effective Mass for Si/SiGe Structures

Salvador Rodríguez | J. Banqueri | J. E. Carceller
  • VLSI Design -
  • Special Issue
  • - Volume 12
  • - Article ID 083474

A Fine Grain Configurable Logic Block for Self-checking FPGAs

P. K. Lala | A. Walker
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 092043

The Deterministic Circuit Model for Noise Influence on the Averaged Transient Responses of Large-scale Nonlinear ICs Analyzed with Itô's Stochastic Differential Equations

Magnus Willander | Yevgeny Mamontov | Jonathan Vincent
  • VLSI Design -
  • Special Issue
  • - Volume 12
  • - Article ID 037087

Test Generators Need to be Modified to Handle CMOS Designs

Jacob Savir
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 045747

Optimization of FIBMOS Through 2D Silvaco ATLAS and 2D Monte Carlo Particle-based Device Simulations

J. Kang | X. He | ... | D. K. Schroder
  • VLSI Design -
  • Special Issue
  • - Volume 12
  • - Article ID 079703

Effect of Reverse Body Bias on Current Testing of 0.18 μm Gates

Xiaomei Liu | Prachi Sathe | Samiha Mourad
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 087371

Simulation of Drastic Lag Phenomena in GaAs-Based FETs for Large Voltage Swing

K. Horio | Y. Mitani | ... | N. Kurosawa
  • VLSI Design -
  • Special Issue
  • - Volume 13
  • - Article ID 041084

A Simple Model for the Quantum Hydrodynamic Simulation of Electron Transport in Quantum Confined Structures in the Presence of Vortices

J. R. Barker
  • VLSI Design -
  • Special Issue
  • - Volume 12
  • - Article ID 032515

BIST-Based Fault Diagnosis in the Presence of Embedded Memories

Jacob Savir
  • VLSI Design -
  • Special Issue
  • - Volume 12
  • - Article ID 075139

Efficient Test Application for Core-Based Systems Using Twisted-Ring Counters

Anshuman Chandra | Krishnendu Chakrabarty | Mark C. Hansen

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