VLSI Design

Evaluation of an Equivalent Hole Effective Mass for Si/SiGe Structures

A Fine Grain Configurable Logic Block for Self-checking FPGAs

The Deterministic Circuit Model for Noise Influence on the Averaged Transient Responses of Large-scale Nonlinear ICs Analyzed with Itô's Stochastic Differential Equations

Quantum Corrections to the ‘Atomistic’ MOSFET Simulations

A Fast Algorithm for Transistor Folding

Test Generators Need to be Modified to Handle CMOS Designs

Optimization of FIBMOS Through 2D Silvaco ATLAS and 2D Monte Carlo Particle-based Device Simulations

Effect of Reverse Body Bias on Current Testing of 0.18 μm Gates

Simulation of Drastic Lag Phenomena in GaAs-Based FETs for Large Voltage Swing

A Simple Model for the Quantum Hydrodynamic Simulation of Electron Transport in Quantum Confined Structures in the Presence of Vortices

BIST-Based Fault Diagnosis in the Presence of Embedded Memories

Efficient Test Application for Core-Based Systems Using Twisted-Ring Counters

Quantum Monte Carlo Study of Silicon Self-interstitial Defects

Wigner Function Methods in Modeling of Switching in Resonant Tunneling Devices

Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis

VLSI Design

Table of Contents

Table of Contents: 2001

Evaluation of an Equivalent Hole Effective Mass for Si/SiGe Structures

A Fine Grain Configurable Logic Block for Self-checking FPGAs

The Deterministic Circuit Model for Noise Influence on the Averaged Transient Responses of Large-scale Nonlinear ICs Analyzed with Itô's Stochastic Differential Equations

Quantum Corrections to the ‘Atomistic’ MOSFET Simulations

A Fast Algorithm for Transistor Folding

Test Generators Need to be Modified to Handle CMOS Designs

Optimization of FIBMOS Through 2D Silvaco ATLAS and 2D Monte Carlo Particle-based Device Simulations

Effect of Reverse Body Bias on Current Testing of 0.18 μm Gates

Simulation of Drastic Lag Phenomena in GaAs-Based FETs for Large Voltage Swing

A Simple Model for the Quantum Hydrodynamic Simulation of Electron Transport in Quantum Confined Structures in the Presence of Vortices

BIST-Based Fault Diagnosis in the Presence of Embedded Memories

Efficient Test Application for Core-Based Systems Using Twisted-Ring Counters

Quantum Monte Carlo Study of Silicon Self-interstitial Defects

Wigner Function Methods in Modeling of Switching in Resonant Tunneling Devices

Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis