VLSI Design

Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop


Publishing date
01 Mar 2008
Status
Published
Submission deadline
01 Oct 2007


Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop

Articles

  • Special Issue
  • - Volume 2008
  • - Article ID 165673
  • - Editorial

Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop

Bozena Kaminska | Marcelo Lubaszewski | José Machado da Silva
  • Special Issue
  • - Volume 2008
  • - Article ID 437879
  • - Research Article

A Dependable Microelectronic Peptide Synthesizer Using Electrode Data

H. G. Kerkhoff | X. Zhang | ... | A. Richardson
  • Special Issue
  • - Volume 2008
  • - Article ID 657207
  • - Research Article

Simple Evaluation of the Nonlinearity Signature of an ADC Using a Spectral Approach

E. J. Peralías | M. A. Jalón | A. Rueda
  • Special Issue
  • - Volume 2008
  • - Article ID 596146
  • - Research Article

Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test

Yves Joannon | Vincent Beroulle | ... | Jean-Louis Carbonero
  • Special Issue
  • - Volume 2008
  • - Article ID 418165
  • - Research Article

Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems

Vishwanath Natarajan | Rajarajan Senguttuvan | ... | Abhjit Chatterjee
  • Special Issue
  • - Volume 2008
  • - Article ID 294014
  • - Research Article

Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing

E. Simeu | H. N. Nguyen | ... | R. Khereddine
  • Special Issue
  • - Volume 2008
  • - Article ID 291686
  • - Research Article

MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing

D. C. Keezer | D. Minier | ... | J. McKillop
  • Special Issue
  • - Volume 2008
  • - Article ID 482159
  • - Research Article

ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator

V. Kerzérho | P. Cauvet | ... | O. Chakib
  • Special Issue
  • - Volume 2008
  • - Article ID 283451
  • - Research Article

A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization

L. A. Rocha | L. Mol | ... | J. Machado da Silva
  • Special Issue
  • - Volume 2008
  • - Article ID 630951
  • - Research Article

A Tool for Single-Fault Diagnosis in Linear Analog Circuits with Tolerance Using the T-Vector Approach

José A. Soares Augusto | Carlos Beltrán Almeida