Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop
Guest Editors: Bozena Kaminska, Marcelo Lubaszewski, and José Machado da Silva- Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop, Bozena Kaminska, Marcelo Lubaszewski, and José Machado da Silva
Volume 2008 (2008), Article ID 165673, 2 pages - ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator, V. Kerzérho, P. Cauvet, S. Bernard, F. Azaïs, M. Renovell, M. Comte, and O. Chakib
Volume 2008 (2008), Article ID 482159, 8 pages - Simple Evaluation of the Nonlinearity Signature of an ADC Using a Spectral Approach, E. J. Peralías, M. A. Jalón, and A. Rueda
Volume 2008 (2008), Article ID 657207, 8 pages - Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test, Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, and Jean-Louis Carbonero
Volume 2008 (2008), Article ID 596146, 9 pages - A Tool for Single-Fault Diagnosis in Linear Analog Circuits with Tolerance Using the T-Vector Approach, José A. Soares Augusto and Carlos Beltrán Almeida
Volume 2008 (2008), Article ID 630951, 8 pages - Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems, Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, and Abhjit Chatterjee
Volume 2008 (2008), Article ID 418165, 10 pages - A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization, L. A. Rocha, L. Mol, E. Cretu, R. F. Wolffenbuttel, and J. Machado da Silva
Volume 2008 (2008), Article ID 283451, 7 pages - Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing, E. Simeu, H. N. Nguyen, P. Cauvet, S. Mir, L. Rufer, and R. Khereddine
Volume 2008 (2008), Article ID 294014, 10 pages - MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing, D. C. Keezer, D. Minier, P. Ducharme, D. Viens, G. Flynn, and J. McKillop
Volume 2008 (2008), Article ID 291686, 8 pages - A Dependable Microelectronic Peptide Synthesizer Using Electrode Data, H. G. Kerkhoff, X. Zhang, F. Mailly, P. Nouet, H. Liu, and A. Richardson
Volume 2008 (2008), Article ID 437879, 9 pages