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Special Issue
Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop
Publishing date
01 Mar 2008
Status
Published
Submission deadline
01 Oct 2007
Guest Editors
Bozena Kaminska
|
Marcelo Lubaszewski
|
José da Silva
Show Affiliation
Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop
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Articles
Special Issue
- Volume 2008
- Article ID 165673
- Editorial
Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop
Bozena Kaminska | Marcelo Lubaszewski | José Machado da Silva
19 Aug 2008
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Special Issue
- Volume 2008
- Article ID 437879
- Research Article
A Dependable Microelectronic Peptide Synthesizer Using Electrode Data
H. G. Kerkhoff | X. Zhang | ... | A. Richardson
05 Aug 2008
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Special Issue
- Volume 2008
- Article ID 657207
- Research Article
Simple Evaluation of the Nonlinearity Signature of an ADC Using a Spectral Approach
E. J. Peralías | M. A. Jalón | A. Rueda
22 Jul 2008
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Special Issue
- Volume 2008
- Article ID 596146
- Research Article
Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test
Yves Joannon | Vincent Beroulle | ... | Jean-Louis Carbonero
25 Jun 2008
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Special Issue
- Volume 2008
- Article ID 418165
- Research Article
Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems
Vishwanath Natarajan | Rajarajan Senguttuvan | ... | Abhjit Chatterjee
23 Jun 2008
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Special Issue
- Volume 2008
- Article ID 294014
- Research Article
Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing
E. Simeu | H. N. Nguyen | ... | R. Khereddine
04 Jun 2008
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Special Issue
- Volume 2008
- Article ID 291686
- Research Article
MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing
D. C. Keezer | D. Minier | ... | J. McKillop
27 May 2008
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Special Issue
- Volume 2008
- Article ID 482159
- Research Article
ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator
V. Kerzérho | P. Cauvet | ... | O. Chakib
30 Apr 2008
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Special Issue
- Volume 2008
- Article ID 283451
- Research Article
A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization
L. A. Rocha | L. Mol | ... | J. Machado da Silva
06 Apr 2008
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Special Issue
- Volume 2008
- Article ID 630951
- Research Article
A Tool for Single-Fault Diagnosis in Linear Analog Circuits with Tolerance Using the T-Vector Approach
José A. Soares Augusto | Carlos Beltrán Almeida
25 Mar 2008
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