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X-Ray Optics and Instrumentation
Table of Contents
Special Issues
X-Ray Optics and Instrumentation
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2008
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Article
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Fig 10
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Research Article
Application of Single and Dual Multilayer Optics for Powder X-Ray Diffraction
Figure 10
Profiles fit to SRM660a LaB
6
using fundamental parameters: (a) is without an additional constant Gaussian convolution; (b) includes the constant Gaussian.
(a)
(b)