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X-Ray Optics and Instrumentation
Table of Contents
Special Issues
X-Ray Optics and Instrumentation
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2008
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Article
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Fig 7
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Research Article
Application of Single and Dual Multilayer Optics for Powder X-Ray Diffraction
Figure 7
Refined lattice constants for urea for each instrumental configuration. Error bars are ±3 estimated standard deviations from the refinements.