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X-Ray Optics and Instrumentation
Table of Contents
Special Issues
X-Ray Optics and Instrumentation
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2008
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Article
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Tab 10
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Research Article
High-Definition X-Ray Fluorescence: Applications
Table 10
Asymmetrical Si(220) DCC optic parameters.
Crystal
Focusing E
Source-optic dist.
Optic-Focus dist.
Flux @ 45w
Measured spot size
Si(220)
17.5 keV
160 mm
80 mm
50
μ
m