Fabrication and Performance Test of Fresnel Zone Plate with 35 nm Outermost Zone Width in Hard X-Ray Region

<table>Schematic view of scanning microscopy setup for bright and dark field method. A lead thin plate (0.5 mm) beam stop is mounted on a rotating stage, and bright-field and dark-field imaging can be exchanged by rotating the beam stop.</table>

X-Ray Optics and Instrumentation

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Figure 6

Figure 6: Fabrication and Performance Test of Fresnel Zone Plate with 35 nm Outermost Zone Width in Hard X-Ray Region 