Effect of Oxygen Mixing Percentage on Mechanical and Microwave Dielectric Properties of SrBi₄Ti₄O₁₅ Thin Films

Figure 1

X-ray diffraction pattern of SrBi₄Ti₄O₁₅ thin films deposited at (a) 25%, (b) 50%, (c) 75%, and (d) 100% of OMP.