857465.fig.005a
(a)
857465.fig.005b
(b)
Figure 5: SEM images of a 125 nm thick BiFeO3 film prepared at a source-to-substrate distance of . (a) was obtained with accelerating voltage of 10 kV. (b) was obtained with 2.5 kV. Large (~50 μm) grains are observed along with smaller features related to the ferroelectric domain structure.