Improved Indium-Free Transparent ZnO/Metal/ZnO Electrode through a Statistical Experimental Design Method

Figure 7

(a) X-ray diffraction spectra of ZAZ films with various Ag thicknesses of 5, 10, and 15 nm grown by using RF power of 150 W and (b) the dependence of resistance and FOM of the ZAZ on the inserted Ag thickness.

(a)

(b)