Modification, Synthesis, and Analysis of Advanced Materials Using Ion Beam Techniques

• Modification, Synthesis, and Analysis of Advanced Materials Using Ion Beam Techniques, Adam Georg Balogh, Koumei Baba, David D. Cohen, Robert G. Elliman, Wolfgang Ensinger, and Joseph Gyulai
  Volume 2012 (2012), Article ID 431297, 2 pages
• Mechanical and Structural Properties of Fluorine-Ion-Implanted Boron Suboxide, Ronald Machaka, Bonex W. Mwakikunga, Elayaperumal Manikandan, Trevor E. Derry, Iakovos Sigalas, and Mathias Herrmann
  Volume 2012 (2012), Article ID 792973, 11 pages
• Effect of Silicon, Titanium, and Zirconium Ion Implantation on NiTi Biocompatibility, L. L. Meisner, A. I. Lotkov, V. A. Matveeva, L. V. Artemieva, S. N. Meisner, and A. L. Matveev
  Volume 2012 (2012), Article ID 706094, 16 pages
• Tunnel Contacts for Spin Injection into Silicon: The Si-Co Interface with and without a MgO Tunnel Barrier—A Study by High-Resolution Rutherford Backscattering, S. P. Dash, D. Goll, P. Kopold, and H. D. Carstanjen
  Volume 2012 (2012), Article ID 902649, 13 pages
• Characteristics and Photocatalytic Properties of Thin Film Prepared by Sputter Deposition and Post-N⁺ Ion Implantation, Haider A. Shukur, Mitsunobu Sato, Isao Nakamura, and Ichiro Takano
  Volume 2012 (2012), Article ID 923769, 7 pages
• Nonstoichiometry in Studied by Ion Beam Methods and Photoelectron Spectroscopy, K. Zakrzewska
  Volume 2012 (2012), Article ID 826873, 13 pages
• Single-Ion Implantation for the Development of Si-Based MOSFET Devices with Quantum Functionalities, Jeffrey C. McCallum, David N. Jamieson, Changyi Yang, Andrew D. Alves, Brett C. Johnson, Toby Hopf, Samuel C. Thompson, and Jessica A. van Donkelaar
  Volume 2012 (2012), Article ID 272694, 10 pages
• Purity of Ion Beams: Analysis and Simulation of Mass Spectra and Mass Interferences in Ion Implantation, Volker Häublein, Heiner Ryssel, and Lothar Frey
  Volume 2012 (2012), Article ID 610150, 9 pages
• Hydrogen Charging Effects in Pd/Ti/TiO₂/Ti Thin Films Deposited on Si(111) Studied by Ion Beam Analysis Methods, K. Drogowska, S. Flege, C. Schmitt, D. Rogalla, H.-W. Becker, Nhu-T. H. Kim-Ngan, A. Brudnik, Z. Tarnawski, K. Zakrzewska, M. Marszałek, and A. G. Balogh
  Volume 2012 (2012), Article ID 269603, 8 pages
• High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM, James A. Whitby, Fredrik Östlund, Peter Horvath, Mihai Gabureac, Jessica L. Riesterer, Ivo Utke, Markus Hohl, Libor Sedláček, Jaroslav Jiruše, Vinzenz Friedli, Mikhael Bechelany, and Johann Michler
  Volume 2012 (2012), Article ID 180437, 13 pages
• The Influence of Pores on Irradiation Property of Selected Nuclear Graphites, Zhengcao Li, Dongyue Chen, Xiaogang Fu, Wei Miao, and Zhengjun Zhang
  Volume 2012 (2012), Article ID 640462, 6 pages
• Preparation and Properties of Ag-Containing Diamond-Like Carbon Films by Magnetron Plasma Source Ion Implantation, K. Baba, R. Hatada, S. Flege, and W. Ensinger
  Volume 2012 (2012), Article ID 536853, 5 pages
• Focused Ion Beam in the Study of Biomaterials and Biological Matter, Kathryn Grandfield and Håkan Engqvist
  Volume 2012 (2012), Article ID 841961, 6 pages
• Application of Resonant Nuclear Reactions for Studying the Diffusion of Nitrogen and Silicon in Ti-Modified Stainless Steel, J. Arunkumar, C. David, K. G. M. Nair, B. K. Panigrahi, and C. S. Sundar
  Volume 2012 (2012), Article ID 640217, 6 pages
• Radiation Effects in Nuclear Ceramics, L. Thomé, S. Moll, A. Debelle, F. Garrido, G. Sattonnay, and J. Jagielski
  Volume 2012 (2012), Article ID 905474, 13 pages