Editorial Board

George G. Adams, Northeastern University, USA
Arvind Agarwal, Florida International University, USA
Mihai Arghir, Université de Poitiers, France
Pranesh B. Aswath, University of Texas at Arlington, USA
Shyam Bahadur, Iowa State University, USA
B. Bhushan, Ohio State University, USA
Navin Chand, Advanced Materials and Processes Research Institute (CSIR), India
Huseyin Çimenoǧlu, Istanbul Technical University, Turkey
Enrico Ciulli, Università di Pisa, Italy
J. Paulo Davim, University of Aveiro, Portugal
Patrick De Baets, Ghent University, Belgium
Abdallah Elsharkawy, Kuwait University, Kuwait
Liang Fang, Xi'an Jiaotong University, China
Kambiz Farhang, Southern Illinois University, USA
Michel Fillon, University of Poitiers, France
K. Friedrich, University of Kaiserslautern, Germany
Hiromu Hashimoto, Tokai University, Japan
Meng Hua, City University of Hong Kong, Hong Kong
Said Jahanmir, National Institute of Standards and Technology, USA
Gun Hee Jang, Hanyang University, Korea
Yuansheng Jin, Tsinghua University, China
Mitjan Kalin, University of Ljubljana, Slovenia
Motohiro Kaneta, Kyushu Institute of Technology, Japan
Yuan Kang, Chung Yuan Christian University, Taiwan
Ajay Kapoor, Swinburne University, Australia
Koji Kato, Tohoku University, Japan
T. G. Keith, University of Toledo, USA
M. M. Khonsari, Louisiana State University, USA
Dae Eun Kim, Yonsei University, Republic of Korea
Bankim C. Majumdar, Indian Institute of Technology, India
Braham Prakash, Luleå University of Technology, Sweden
Richard Salant, Georgia Institute of Technology, USA
Jerzy T. Sawicki, Cleveland State University, USA
Ian Sherrington, University of Central Lancashire, United Kingdom
Sujeet Kumar Sinha, National University of Singapore, Singapore
G. W. Stachowiak, University of Western Australia, Australia
Andras Z. Szeri, University of Delaware, USA
J. Vižintin, University of Ljubljana, Poland
Anna Walicka, University of Zielona Gora, Poland
Qian Wang, Northwester University, USA
Si-Wei Zhang, University of Petroleum, China