Novel Complete Probabilistic Models of Random Variation in High Frequency Performance of Nanoscale MOSFET

<table>NMOS-based graphical comparison for the probability distribution of <svg height="18.65" id="M186" style="vertical-align:-5.76988pt" version="1.1" viewbox="0 0 30.4 18.65" width="30.4" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink">
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</svg> (line) versus benchmark distribution from the circuit (histogram).</table>

Journal of Electrical and Computer Engineering

fig3

Figure 3

Figure 3: Novel Complete Probabilistic Models of Random Variation in High Frequency Performance of Nanoscale MOSFET 