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VLSI Design
Volume 5 (1997), Issue 3, Pages i-ii
http://dx.doi.org/10.1155/1997/90247
Guest Editorial

Advancements in Power Supply Current Testing

The University of North Carolina, Charlotte, USA

Copyright © 1997 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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