Research Article
A Discrete Event System Approach to Online Testing of Speed Independent Circuits
Table 4
Area ratio for the Mutex approach.
| CUT | Circuits for OLT | Area overhead ratio for Mutex method |
| 2 David cells | 2 David cells + 2 Mutex elements + gates | 3.3 | 4 David cells | 4 David cells + 4 Mutex elements + gates | 4.9 |
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