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X-Ray Optics and Instrumentation
Table of Contents
Special Issues
X-Ray Optics and Instrumentation
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2008
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Article
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Fig 6
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Research Article
Application of Single and Dual Multilayer Optics for Powder X-Ray Diffraction
Figure 6
Peak FWHM (
) for SRM640c Si powder using the PM and
configurations. Error bars are ±1 estimated standard deviation from profile fitting.