A Unified Approach for Predicting Long- and Short-Term Capability Indices with Dependence on Manufacturing Target Bias

<table>Comparison of built-in inverse error function 
[<a href="/journals/jqre/2008/594753/#B11">12</a>] and analytic approximation 
[<a href="/journals/jqre/2008/594753/#B9a">9</a>, <a href="/journals/jqre/2008/594753/#B9b">10</a>].</table>

Journal of Quality and Reliability Engineering

fig7

Figure 7

Figure 7: A Unified Approach for Predicting Long- and Short-Term Capability Indices with Dependence on Manufacturing Target Bias 