Research Article

Concentration and Annealing Effects on Luminescence Properties of Ion-Implanted Silica Layers

Figure 5

Room temperature CL spectra of (a) Pb+, (b) Sn+, (c) Ge+ implanted SiO2 layers with thicknesses  nm and implantation doses  cm−2. After ion implantation, the samples were thermally post-annealed at °C.
326368.fig.005a
(a)
326368.fig.005b
(b)
326368.fig.005c
(c)