DC Conduction and Switching Mechanisms in Electroformed Al/ZnTe:V/Cu Devices at Atmospheric Pressure

<table><i>I-V</i> aging effects for a 150 nm thick Al/ZnTe:V/Cu structure of a composition 2.5 wt% V:  (■) virgin film,  (▲) one hour, and (<i>▼</i>) one week.</table>

International Scholarly Research Notices

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Figure 5

Figure 5: DC Conduction and Switching Mechanisms in Electroformed Al/ZnTe:V/Cu Devices at Atmospheric Pressure 