Effect of Annealing Atmosphere on the Properties of Electrochemically Deposited Cu<sub>2</sub>ZnSnS<sub>4</sub> (CZTS) Thin Films

<table>X-ray diffraction patterns of as-deposited precursor film and annealed CZTS thin films annealed at 550°C in various annealing atmosphere.</table>

International Scholarly Research Notices

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Figure 1

Figure 1: Effect of Annealing Atmosphere on the Properties of Electrochemically Deposited Cu<sub>2</sub>ZnSnS<sub>4</sub> (CZTS) Thin Films 

International Scholarly Research Notices

Effect of Annealing Atmosphere on the Properties of Electrochemically Deposited Cu2ZnSnS4 (CZTS) Thin Films

Figure 1

Effect of Annealing Atmosphere on the Properties of Electrochemically Deposited Cu₂ZnSnS₄ (CZTS) Thin Films