The Effect of Film Thickness on the Structural Properties of Vacuum Evaporated  Poly(3-methylthiophene) Thin Films

<table class="table-group" id="tab1"><tr><td><table class="table"><tr><td class="thead-hr" colspan="4"><hr/></td></tr><tr><td align="left" rowspan="2"> Sr. no.</td><td align="center" rowspan="2">
									
									Thickness of the film in nm</td><td align="center" colspan="2">Root mean square (RMS) roughness (nm)</td></tr><tr><td align="center">Vapour chopped</td><td align="center">Nonchopped </td></tr><tr><td align="center" colspan="4"><hr/></td></tr><tr><td align="left">01</td><td align="center">150</td><td align="center">20</td><td align="center">22</td></tr><tr><td align="left">02</td><td align="center">200</td><td align="center">11</td><td align="center">19</td></tr><tr><td align="left">03</td><td align="center">250</td><td align="center">10.6</td><td align="center">16</td></tr><tr class="table-tr"><td colspan="4"><hr class="tbody-hr"/></td></tr></table></td></tr></table>

International Scholarly Research Notices

tab1

Table 1

Table 1: The Effect of Film Thickness on the Structural Properties of Vacuum Evaporated  Poly(3-methylthiophene) Thin Films 