Second-Order Nonlinear Optical Microscopy of a H–Si(111)1 × 1 Surface in Ultra-High Vacuum Conditions

<table>Schematic diagram of the SFG and SHG microscopic system for UHV conditions.</table>

Physics Research International

Figure 1: Second-Order Nonlinear Optical Microscopy of a H–Si(111)1 × 1 Surface in Ultra-High Vacuum Conditions 