Advanced Nanomeasuring Techniques for Surface Characterization

<table class="table-group" width="800px"><tr class="fig-image" id="a"><td><img alt="859353.fig.0010a" src="https://static.hindawi.com/articles/isrn/volume-2012/859353/figures/859353.fig.0010a.jpg"/></td></tr><tr class="fig-caption"><td align="center"><table><tr><td><b>(a) </b>Principle of a WLI. Figure is taken from [<a href="/journals/isrn/2012/859353/#B71">69</a>] </td></tr></table></td></tr><tr class="fig-image" id="b"><td><img alt="859353.fig.0010b" src="https://static.hindawi.com/articles/isrn/volume-2012/859353/figures/859353.fig.0010b.jpg"/></td></tr><tr class="fig-caption"><td align="center"><table><tr><td><b>(b) </b>Schematic diagram of setting. Figure is taken from [<a href="/journals/isrn/2012/859353/#B72">70</a>] </td></tr></table></td></tr></table>

<table>Principle and schematic diagram of a white light interferometer (WLI) system. </table>

International Scholarly Research Notices

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Figure 10

Figure 10: Advanced Nanomeasuring Techniques for Surface Characterization 