Research Article

Synthesis and Characterization of Screen Printed Zn0.97Cu0.03O Thick Film for Semiconductor Device Applications

Table 1

XRD parameters: -values (reported and observed), hkl plane, and lattice parameters (, ) of the Zn0.97Cu0.03O thick film.

hkl plane-Value (Å)Cell parameters (Å)
Wurtzite structure (hexagonal phase)
ReportedObserved

1002.812.771
0022.612.581
1012.442.42793.185.21
1021.891.876
1101.631.609
1031.461.453