Table of Contents
Advances in Optical Technologies
Volume 2008 (2008), Article ID 689715, 10 pages
http://dx.doi.org/10.1155/2008/689715
Research Article

Stress Induced Effects for Advanced Polarization Control in Silicon Photonics Components

1Institute for Microstructural Sciences, National Research Council Canada (NRC), Ottawa, ON, Canada K1A 0R6
2Department of Electronics, Carleton University, 1125 Colonel By Drive, Ottawa, ON, Canada K1S 5B6

Received 24 January 2008; Accepted 11 March 2008

Academic Editor: D. Lockwood

Copyright © 2008 D.-X. Xu et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

D.-X. Xu, W. N. Ye, S. Janz, et al., “Stress Induced Effects for Advanced Polarization Control in Silicon Photonics Components,” Advances in Optical Technologies, vol. 2008, Article ID 689715, 10 pages, 2008. doi:10.1155/2008/689715