Detection and Localization of Defects in Monocrystalline Silicon Solar Cell

<table>Defect noise current versus reverse voltage of the solar cell wafer. Numbers show a noise signal. By repeating a measurement, the noise current figure always appears at same bias voltages.</table>

Advances in Optical Technologies

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Figure 2

Figure 2: Detection and Localization of Defects in Monocrystalline Silicon Solar Cell 