Detection and Localization of Defects in Monocrystalline Silicon Solar Cell

<table>Localization of defects imperfection areas of solar cell wafer using reverse-bias light emission from different wafer sites (<svg height="15.4" id="M8" style="vertical-align:-3.3907pt" version="1.1" viewbox="0 0 81.300003 15.4" width="81.300003" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink">
<g transform="matrix(.017,-0,0,-.017,.062,11.112)"><path d="M751 650l-6 -28q-53 -1 -69 -12.5t-24 -38.5q-23 -85 -43 -192l-13 -69q-34 -181 -130 -262q-79 -65 -185 -65t-171 57q-87 77 -54 258l42 232q12 58 0.5 73t-75.5 19l8 28h263l-6 -28q-63 -5 -78 -18t-26 -74l-41 -226q-25 -135 22 -201t139 -66q99 0 161.5 68t91.5 217
l11 57q28 149 28 193q0 28 -19 38t-79 12l6 28h247z" id="x1D448"></path></g>
<g transform="matrix(.012,-0,0,-.012,13.038,15.187)"><path d="M393 379q-9 -16 -28 -29q-15 -10 -23 -2q-19 19 -36 19q-21 0 -52 -38q-57 -72 -82 -126l-40 -197q-23 -3 -75 -18l-7 7q49 196 74 335q7 43 -2 43q-7 0 -30 -14.5t-47 -37.5l-16 23q37 42 82 73t67 31q41 0 15 -113l-11 -50h4q41 71 85 117t77 46q29 0 45 -26
q13 -21 0 -43z" id="x1D45F"></path></g>
<g transform="matrix(.017,-0,0,-.017,23.4,11.112)"><path d="M535 323h-483v50h483v-50zM535 138h-483v50h483v-50z" id="x3D"></path></g><g transform="matrix(.017,-0,0,-.017,38.087,11.112)"><path d="M384 0h-275v27q67 5 81.5 18.5t14.5 68.5v385q0 38 -7.5 47.5t-40.5 10.5l-48 2v24q85 15 178 52v-521q0 -55 14.5 -68.5t82.5 -18.5v-27z" id="x31"></path></g><g transform="matrix(.017,-0,0,-.017,46.246,11.112)"><path d="M249 635q70 0 116 -43t46 -105q0 -46 -28 -80q-22 -25 -80 -64q62 -35 97 -75t35 -99q0 -81 -63 -131t-135 -50q-83 0 -137.5 45.5t-54.5 123.5q0 52 45 95q29 28 89 64q-109 62 -109 155q0 66 50.5 115t128.5 49zM238 603q-42 0 -67.5 -31t-25.5 -72q0 -50 32.5 -79.5
t98.5 -62.5q61 48 61 124q0 59 -29.5 90t-69.5 31zM248 20q46 0 76.5 33.5t30.5 89.5q0 50 -39 85.5t-110 71.5q-81 -54 -81 -137q0 -67 35.5 -105t87.5 -38z" id="x38"></path></g><g transform="matrix(.017,-0,0,-.017,54.406,11.112)"><path d="M113 -12q-24 0 -39.5 16t-15.5 42q0 24 16 40.5t40 16.5t40 -16.5t16 -40.5q0 -26 -16 -42t-41 -16z" id="x2E"></path></g><g transform="matrix(.017,-0,0,-.017,58.281,11.112)"><path d="M153 550l-26 -186q79 31 111 31q90 0 141.5 -51t51.5 -119q0 -93 -89 -166q-85 -69 -173 -71q-32 0 -61.5 11.5t-41.5 23.5q-18 17 -17 34q2 16 22 33q14 9 26 -1q61 -50 124 -50q60 0 93 43.5t33 104.5q0 69 -41.5 110t-121.5 41q-53 0 -102 -20l38 305h286l6 -8
l-26 -65h-233z" id="x35"></path></g><g transform="matrix(.017,-0,0,-.017,69.28,11.112)"><path d="M687 650v-28q-52 -6 -71.5 -23t-47.5 -83q-142 -346 -208 -527h-31q-119 325 -207 545q-21 54 -39.5 68.5t-65.5 19.5v28h245v-28q-52 -5 -61.5 -15.5t3.5 -43.5q55 -157 166 -437h2q120 303 158 421q14 43 3.5 55.5t-71.5 19.5v28h225z" id="x56"></path></g>
</svg>).</table>

Advances in Optical Technologies

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Figure 3

Figure 3: Detection and Localization of Defects in Monocrystalline Silicon Solar Cell 