Detection and Localization of Defects in Monocrystalline Silicon Solar Cell

<table>SNOM experimental setup for the measurement of effective values of  electric response, optical properties—reflectance, and topography of solar cell in the near-field.</table>

Advances in Optical Technologies

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Figure 4

Figure 4: Detection and Localization of Defects in Monocrystalline Silicon Solar Cell 