Laser-Combined Scanning Tunneling Microscopy on the Carrier Dynamics in Low-Temperature-Grown GaAs/AlGaAs/GaAs
Figure 4
Results of time-resolved measurement ( versus curves) for (a) GaAs (400 nm from the GaAs/AlGaAs interface), (b) AlGaAs (180 nm from the AlGaAs/GaAs interface), and (c) LT-GaAs (75 nm from the AlGaAs/LT-GaAs interface) regions. , .