(a) Histogram showing the wavelength distribution of 60,000 VCSELs tested at 40°C on a 4′′ wafer. (b) Threshold current versus wavelength. (c) Peak output power versus wavelength. The shaded regions in (b) and (c) indicate the wavelength range corresponding to the vast majority of devices on the wafer (from Proceedings of the SPIE, Vol. 7952, paper 795208).
