|
| Fibril | Young’s modulus (GPa) | 0.43 | X-ray diffraction (Sasaki and Odajima, 1996a) |
| Average value 0.9 | 0.4–0.5 | MEMS stretching (Eppell et al., 2006) |
| 0.2–0.5 | AFM testing (Van Der Rijt et al., 2006) |
| 0.86 ± 0.45 | MEMS testing (Shen et al., 2008) |
| 0.47 ± 0.41 | MEMS testing (Shen et al., 2010) |
| 2.89 ± 0.23 | AFM testing (Svensson et al., 2010a) |
| 1.87–1.94 | AFM testing (Svensson et al., 2010b) |
| 0.3–1.2 | Atomisticmodeling (Gautieri et al., 2011) |
| 0.12 ± 0.05 | MEMS testing (Shen et al., 2011) |
| Viscosity (GPa-s) | 0.09–1.63 | MEMS testing (Shen et al., 2011) |
| Relaxation time (s) | 7–102 | MEMS testing (Shen et al., 2011) |
|
| Molecule | Young’s modulus (GPa) | ≈9 | Brillouin light scattering (Harley et al., 1977) |
| Average value 5.4 GPa | ≈5.1 | Brillouin light scattering (Cusack and Miller, 1979) |
| 3–5.1 | Estimate from persistence length (Hofmann et al., 1984) |
| 2.9 ± 0.1 | X-ray diffraction (Sasaki and Odajima, 1996b) |
| 0.35–12 | Optical trap (Sun et al., 2002) |
| ≈7 | Reactive atomistic modeling (Buehler, 2006) |
| 4.59 ± 0.38 | Atomistic modeling (Gautieri et al., 2008) |
| ≈4 | Atomistic modeling (Gautieri et al., 2009a) |
| 4.62 ± 0.41 | Coarse-grain modeling (Gautieri et al., 2010) |
| 6–16 | Atomistic creep test [present work] |
| Viscosity (GPa-s) | (3.84 ± 0.38) · 10−9 | Atomistic creep test [present work] |
| Relaxation time (s) | ≈0.5 · 10−9 | Atomistic creep test [present work] |
|
