Research Article

A New Process for On-Chip Inductors with High Q-Factor Performance

Figure 2

(a) Schematic cross-section of inductor with supporting pillars in all metal layers, resist mask for oxide etching. (b) Schematic cross-section of inductor after 1st step oxide removal by anisotropic oxide etch. (c) Schematic cross-section of inductor after 2nd step oxide removal by isotropic oxide etch. (d) Layer thicknesses of oxide and metal.
517187.fig.002a
(a)
517187.fig.002b
(b)
517187.fig.002c
(c)
517187.fig.002d
(d)