Table of Contents
International Journal of Microwave Science and Technology
Volume 2015, Article ID 219195, 8 pages
Research Article

Characterization of NixZn1−xFe2O4 and Permittivity of Solid Material of NiO, ZnO, Fe2O3, and NixZn1−xFe2O4 at Microwave Frequency Using Open Ended Coaxial Probe

1Department of Physics, Faculty of Science, Universiti Putra Malaysia, 43400 Serdang, Malaysia
2Faculty of Sciences, Technology and Human Development, Universiti Tun Hussein Onn Malaysia, 86400 Batu Pahat, Malaysia
3Advanced Materials and Nanotechnology Laboratory, Institute of Advanced Technology, Universiti Putra Malaysia, 43400 Serdang, Malaysia

Received 10 May 2015; Accepted 28 September 2015

Academic Editor: Samir Trabelsi

Copyright © 2015 Fahmiruddin Esa et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


This paper describes a detailed study on the application of an open ended coaxial probe technique to determine the permittivity of in the frequency range between 1 GHz and 10 GHz. The compositions of the spinel ferrite were 0.1, 0.3, 0.5, 0.7, and 0.9. The samples were prepared by 10-hour sintering at 900°C with 4°C/min increment from room temperature. Particles showed phase purity and crystallinity in powder X-ray diffraction (XRD) analysis. Surface morphology measurement of scanning electron microscopy (SEM) was conducted on the plane surfaces of the molded samples which gave information about grain morphology, boundaries, and porosity. The tabulated grain size for all samples was in the range of 62 nm–175 nm. The complex permittivity of Ni-Zn ferrite samples was determined using the Agilent Dielectric Probe Kit 85070B. The probe assumed the samples were nonmagnetic homogeneous materials. The permittivity values also provide insights into the effect of the fractional composition of on the bulk permittivity values . Vector Network Analyzer 8720B (VNA) was connected via coaxial cable to the Agilent Dielectric Probe Kit 85070B.