International Journal of Microwave Science and Technology

Microwave and Millimeter-Wave Sensors, Systems and Techniques for Electromagnetic Imaging and Materials Characterization

Publishing date
02 Nov 2012
Submission deadline
13 Jul 2012

1Applied Microwave Nondestructive Testing Laboratory (amntl), Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO, USA

2Anritsu Company, Morgan Hill, CA, USA

Microwave and Millimeter-Wave Sensors, Systems and Techniques for Electromagnetic Imaging and Materials Characterization


Microwave and millimeter-wave systems have been acquiring an ever-growing importance in the field of imaging and materials characterization. In recent years, new applications have been explored and novel solutions have been proposed. This interest is primarily motivated by the many advantages of microwave and millimeter-wave systems, such as low cost, low transmission energy, nonhazardous behavior, portability and capability of in situ measurements, and possibility of directly retrieving physical parameters (such as the dielectric properties) of inspected objects. However, new challenges must be faced in order to develop efficient circuits and systems able to provide the required measurement capabilities. Moreover, new processing paradigms are needed for extracting as much information as possible from the acquired data and for presenting the inspection results to nontechnical users/personnel of these assessment systems.

This special issue will report state-of-the-art research on microwave and millimeter-wave components, sensor and antenna design, data processing methodologies, imaging applications, and other related areas. Researchers are invited to contribute with original research articles or with review articles concerning new components and systems design, methodologies for integrating and calibrating imaging and measurement apparatuses, numerical imaging methods, and practical applications of microwave and millimeter-wave systems. Potential topics include, but are not limited to:

  • Circuits and components for microwave and millimeter-wave imaging systems
  • Sensors and antenna design, including characterization and modeling technologies
  • Active and passive probe calibration
  • Dielectric and magnetic material characterization
  • Numerical methods for electromagnetic imaging
  • Test benches and experimental validation of electromagnetic imaging methodologies
  • Applications of imaging systems in biomedical, civil, and/or industrial fields
  • Metrology and novel instrumentation

Before submission authors should carefully read over the journal's Author Guidelines, which are located at Prospective authors should submit an electronic copy of their complete manuscript through the journal Manuscript Tracking System at according to the following timetable:


Article of the Year Award: Outstanding research contributions of 2021, as selected by our Chief Editors. Read the winning articles.