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International Journal of Plant Genomics
Volume 2009 (2009), Article ID 410825, 11 pages
Research Article

Mapping Quantitative Trait Loci Using Distorted Markers

Department of Botany and Plant Sciences, University of California, Riverside, CA 92521, USA

Received 21 September 2009; Accepted 13 November 2009

Academic Editor: Manuel Talon

Copyright © 2009 Shizhong Xu and Zhiqiu Hu. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Quantitative trait locus (QTL) mapping is usually performed using markers that follow a Mendelian segregation ratio. We developed a new method of QTL mapping that can use markers with segregation distortion (non-Mendelian markers). An EM (expectation-maximization) algorithm is used to estimate QTL and SDL (segregation distortion loci) parameters. The joint analysis of QTL and SDL is particularly useful for selective genotyping. Application of the joint analysis is demonstrated using a real life data from a wheat QTL mapping experiment.