International Scholarly Research Notices / 2012 / Article / Fig 1

Research Article

Barrier Evaluation by Linearly Increasing Voltage Technique Applied to Si Solar Cells and Irradiated Pin Diodes

Figure 1

(a) Sketch of the measurement circuitry for implementation of the BELIV technique. GLIV generator of linearly increasing voltage. (b) Measurement circuitry for profiling of doping and defects density. LS is a continuous-wave infrared (IR) light source employed to vary expediently a filling of deep centers.
543790.fig.001a
(a)
543790.fig.001b
(b)

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