Barrier Evaluation by Linearly Increasing Voltage Technique Applied to Si Solar Cells and Irradiated Pin Diodes
Figure 1
(a) Sketch of the measurement circuitry for implementation of the BELIV technique. GLIV generator of linearly increasing voltage. (b) Measurement circuitry for profiling of doping and defects density. LS is a continuous-wave infrared (IR) light source employed to vary expediently a filling of deep centers.
