Table of Contents
ISRN Polymer Science
Volume 2012 (2012), Article ID 570363, 8 pages
Research Article

The Effect of Film Thickness on the Structural Properties of Vacuum Evaporated Poly(3-methylthiophene) Thin Films

1Vacuum Techniques & Thin Film Laboratory, USIC, Shivaji University, Kolhapur, India
2Department of Physics, Shivaji University, Kolhapur 416004, India

Received 5 January 2012; Accepted 8 February 2012

Academic Editors: B. F. Senkal and K. Xu

Copyright © 2012 Sandip V. Kamat et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


This paper reports on the structural properties of poly(3-methylthiophene) P3MeT thin films prepared by vacuum evaporation on the glass substrates. The structural and surface morphology, wettability, adhesion, and intrinsic stress of these thin films were studied for three different thicknesses. The variation of the film thickness affects the structure, surface, and mechanical properties of P3MeT thin films. Vapor chopping also strongly influences the surface morphology, surface roughness, and wettability of the thin films. It was found that there is a decrease in the intrinsic stress and (RMS) roughness, while the adhesion increases with increase in film thickness.