Table of Contents
ISRN Optics
Volume 2012, Article ID 841695, 4 pages
Research Article

SCLC Degradation in 980 nm Pump Laser by Using Electrical Noise

1Centre dโ€™Electronique et de Microoptoรฉlectronique de Montpellier (CEM2), Universitรฉ Montpellier II, 34095 Montpellier Cedex 5, France
2HIRLA, Damascus University, 99 Damascus, Syria

Received 16 November 2011; Accepted 5 December 2011

Academic Editors: R. Jรคger and D.-N. Wang

Copyright © 2012 B. Orsal and I. Asaad. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


The knowledge of the noise levels is important for pump laser diodes as it allows to study and to locate the noise sources and their origin. 980 nm fresh and aged pump lasers have been characterized by using electrical noise measurements. At 10 Hz, the spectra are dominated by 1 / ๐‘“ ๐‘š ( 1 โ‰ค ๐‘š โ‰ค 2 ) noise. Current noise spectral density (CNSD) is dominated by ๐ผ ๐‘š ๐ฟ ( 1 < ๐‘š โ‰ค 2 ). The trapping defect density near the n+n- and p+p- interfaces is related to pinching of the space-charge-limited current (SCLC) effect. An excess electrical noise due to longitudinal mode hopping is correlated with optical power fluctuations.