Table of Contents
ISRN Condensed Matter Physics
Volume 2013 (2013), Article ID 142029, 6 pages
Research Article

Thickness-Dependent Physical Properties of Coevaporated Cu4SnS4 Films

Department of Physics, Sri Venkateswara University, Tirupati 517 502, India

Received 17 May 2013; Accepted 17 June 2013

Academic Editors: S. Krukowski, Y. Ohta, T. Prokscha, and S. Wang

Copyright © 2013 V. P. Geetha Vani et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

V. P. Geetha Vani, M. Vasudeva Reddy, and K. T. Ramakrishna Reddy, “Thickness-Dependent Physical Properties of Coevaporated Cu4SnS4 Films,” ISRN Condensed Matter Physics, vol. 2013, Article ID 142029, 6 pages, 2013. doi:10.1155/2013/142029