Research Article

Potentiostatic Deposition and Characterization of Cuprous Oxide Thin Films

Figure 3

The variation of against photon energy (eV) for deposited films at different deposition times: (a) 5, (b) 10, (c) 15, and (d) 30 min.
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(a)
271545.fig.003b
(b)
271545.fig.003c
(c)
271545.fig.003d
(d)